Isabell Dicillia-Kovatsch is one of the experts working at the Defect Density group at Infineon Technologies Austria AG, Villach. She has been working in the field of semiconductors since 2017, currently with a special focus on Defect Density on GaN.
She holds a Dipl. Ing. degree in Information and Communication Engineering from the Alpen-Adria-Universität Klagenfurt, Austria.
Technical Vision Talk: “The power of computer vision: enhancing manufacturing quality control by automated image classification”